yield-learning

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MostafaIhab20 / Semiconductor_Wafer_Map_Classifier_PyTorch

Automated semiconductor wafer defect pattern recognition on the WM-811K dataset using PyTorch. Implements custom CNN architectures, weighted loss handling for severe class imbalance, and end-to-end evaluation for yield analysis.

computer-vision deep-learning cnn pytorch semiconductor defect-detection wafer-map wm811k yield-learning

Updated Sep 30, 2026
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RifatHossaiN47 / conference_semiconductor

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🚀 Official code for IEEE ECCE 2025 paper: "Advancing Semiconductor Fabrication: A CNN-Based Wafer Defect Detection with XAI Insights". ResNet50 classifier (94.08% accuracy) with Explainable AI (Grad-CAM) on the WM-811K benchmark.

computer-vision deep-learning tensorflow keras grad-cam semiconductor explainable-ai xai resnet50 ieee-conference defect-classification wm-811k wafer-defect-detection yield-learning

Updated Sep 26, 2026
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